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A Comparison of Detection Systems for Trace Phase Analysis

Published online by Cambridge University Press:  06 March 2019

Stephen B. Robie  and
Thomas R. Scalzo
Stephen B. Robie
Affiliation:
Texaco Research Center P.O. Box 509 Beacon, New York 12508
Thomas R. Scalzo
Affiliation:
Texaco Research Center P.O. Box 509 Beacon, New York 12508
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Extract

Since the introduction of semiconductor detectors with sufficient energy resolution to resolve K-alpha X-rays from the K-beta X-rays for first row transition metals, there have been several attempts (1,2) to replace traditional detector systems (scintillation detector/graphite monochromator or proportional counter/nickel filter) in X-ray diffraction with semiconductor detectors. The goal of these experiments was to increase the total system detection efficiency by combining the K-beta discrimination and X-ray detection into a single operation. These early attempts showed that the semiconductor detector based system was more efficient, however, the problem of large dead-time losses hampered development in this area.

Type
X. XRD Applications
Information
Advances in X-Ray Analysis , Volume 28: Thirty-Third Annual Conference on Applications of X-ray Analysis, July 30 - August 3, 1984 , 1984 , pp. 361 - 365
Copyright
Copyright © International Centre for Diffraction Data 1984

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References

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