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Trace Element Analysis of Rocks by X-ray Spectrometry

Published online by Cambridge University Press:  06 March 2019

Bruce W. Chappell
Bruce W. Chappell*
Affiliation:
Department of Geology The Australian National University GPO Box 4, Canberra, ACT 2601, Australia
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Extract

Undoubtedly the most important applications of X-ray fluorescence spectrometry (XRF) have been in the analysis of major elements where the technique provides a unique method of measuring the concentration of all elements having Z > 10 with extremely good precision in a wide range of matrices. However, XRF is in addition a powerful method for trace element analysis. In this discussion, the principles of the method for the trace element analysis of rocks are outlined, its capabilities are summarized, and the advantages and disadvantages of the technique are pointed out.

Type
VI. Geological and Other Applications of X-Ray Spectrometry
Information
Advances in X-Ray Analysis , Volume 34: Thirty-Ninth Annual Conference on Applications of X-ray Analysis, July 30 - August 3, 1990 , 1990 , pp. 263 - 276
Copyright
Copyright © International Centre for Diffraction Data 1990

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References

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