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Application of backscattered electron microscopy in shale petrology

Published online by Cambridge University Press:  01 May 2009

D. H. Krinsley ,
K. Pye  and
A. T. Kearsley
D. H. Krinsley
Affiliation:
Department of Geology, Arizona State University, Tempe, AZ 85287, USA
K. Pye
Affiliation:
Department of Earth Sciences, Downing Street, Cambridge CB2 3EQ, England
A. T. Kearsley
Affiliation:
Department of Geology and Physical Sciences, Oxford Polytechnic, Headington Hill, Oxford
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Summary

A grey pyritic mudstone from Central Wales (Red Vein unit of the Dicellograptus anceps zone, Upper Ordovician Ashgill) has been examined in thin section by scanning electron microscopy using backscattered electrons. Using backscatter it is possible to identify individual mineral constituents of the mudstone by virtue of their atomic number (Z) contrast and differential hardness (relief). The amount of detail observable is far greater than that possible with optical microscopy. Valuable information can be obtained relating to particle form, orientation, texture and internal structure which aids in interpretation of the deformational and diagenetic history of the rock. The adoption of electron microscopical methods in the study of thin sections and polished rock chip surfaces promises to revolutionize the field of shale petrology.

Type
Articles
Information
Geological Magazine , Volume 120 , Issue 2 , March 1983 , pp. 109 - 114
Copyright
Copyright © Cambridge University Press 1983

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References

REFERENCES

Ball, M. D. & McCartney, D. G. 1981. The measurement of atomic number and composition in an SEM using backscattered detectors. J. Microscopy 124, 57–68.CrossRefGoogle Scholar
Blatt, H. 1982. Sedimentary Petrology. San Francisco: Freeman.Google Scholar
Craig, J., Fitches, W. R. & Maltman, A. J. 1982. Chlorite-mica stacks in low strain rocks from central Wales. Geol. Mag. 119, 243–56.CrossRefGoogle Scholar
Goldstein, J. I., Newbury, D. E., Echlin, P., Joy, D. C., Fiori, C. & Lifshin, E. 1981. Scanning Electron Microscopy and X-ray Microanalysis. New York: Plenum Press.Google Scholar
Hall, M. G. & Lloyd, G. E. 1981. The SEM examination of geological samples with a semi conductor back-scattered electron detector. Am. Mineral. 66, 362–8.Google Scholar
Hall, M. G. & Skinner, G. K. 1981. Use of a multi-channel pulse height analyzer for the analysis of back-scattered images. J. Microscopy 124, 69–75.Google Scholar
Hey, M. H. 1954. A new review of the chlorites. Min. Mag. 30, 277–92.Google Scholar
Potter, P. E., Maynard, J. B. & Pryor, W. A. 1980. Sedimentology of Shale. New York: Springer Verlag.CrossRefGoogle Scholar
Roberts, B. 1981. Low grade and very low grade regional metabasic Ordovician rocks of Llyn and Snowdonia, Gwynedd, North Wales. Geol. Mag. 118, 189–200.CrossRefGoogle Scholar
Robinson, B. W. & Nickel, E. H. 1979. A useful new technique for mineralogy: the backscattered electron/low vacuum mode of SEM operation. Am. Mineral. 64, 1322–8.Google Scholar
Robinson, V. N. E. 1980. Imaging with backscattered electrons in a scanning electron microscope. Scanning 3, 15–26.CrossRefGoogle Scholar
Wells, O. C. 1978. Penetration effects at sharp edges in the scanning electron microscope. Scanning 1, 58–62.Google Scholar