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Characterization of superconducting SmBa2Cu3O7 films grown by pulsed laser deposition

Published online by Cambridge University Press:  31 January 2011

Q. X. Jia ,
S. R. Foltyn ,
J. Y. Coulter ,
J. F. Smith  and
M. P. Maley
Q. X. Jia
Affiliation:
Superconductivity Technology Center, Mail Stop K763, Los Alamos National Laboratory, Los Alamos, New Mexico 87545
S. R. Foltyn
Affiliation:
Superconductivity Technology Center, Mail Stop K763, Los Alamos National Laboratory, Los Alamos, New Mexico 87545
J. Y. Coulter
Affiliation:
Superconductivity Technology Center, Mail Stop K763, Los Alamos National Laboratory, Los Alamos, New Mexico 87545
J. F. Smith
Affiliation:
Superconductivity Technology Center, Mail Stop K763, Los Alamos National Laboratory, Los Alamos, New Mexico 87545
M. P. Maley
Affiliation:
Superconductivity Technology Center, Mail Stop K763, Los Alamos National Laboratory, Los Alamos, New Mexico 87545
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Abstract

We have investigated epitaxial superconducting SmBa2Cu3O7 (Sm123) films grown by pulsed-laser deposition on single-crystal SrTiO3 substrates. The deposition temperature plays an important role in determining the superconducting properties of Sm123 films. The superconducting transition temperature increases with the deposition temperature whereas the transition width decreases at deposition temperatures in the range of 700–875 °C. A Sm123 film deposited at 850 °C exhibits a transition temperature above 93 K with a transition width less than 0.5 K. Even though Sm123 films exhibit a higher transition temperature than Yba2Cu3O7 (Y123), the Sm123 shows lower critical current density at liquid-nitrogen temperature. The nominal critical current density of Sm123 film is less than 1 MA/cm2 at 75.4 K. Nevertheless, the Sm123 films have less anisotropy and stronger pinning characteristics compared to Y123. They are also much smoother with fewer particulates, as revealed by scanning electron microscopy.

Type
Articles
Information
Journal of Materials Research , Volume 17 , Issue 10 , October 2002 , pp. 2599 - 2603
Copyright
Copyright © Materials Research Society 2002

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References

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