Hostname: page-component-848d4c4894-x5gtn Total loading time: 0 Render date: 2024-06-09T03:31:25.841Z Has data issue: false hasContentIssue false

High resolution electron microscopy study of the cationic disorder in Al2TiO5

Published online by Cambridge University Press:  31 January 2011

T. Epicier*
Affiliation:
National Center for Electron Microscopy, Materials Science Division, Lawrence Berkeley Laboratory, 1 Cyclotron Road, Berkeley, California 94720
G. Thomas
Affiliation:
National Center for Electron Microscopy, Materials Science Division, Lawrence Berkeley Laboratory, 1 Cyclotron Road, Berkeley, California 94720
H. Wohlfromm*
Affiliation:
National Center for Electron Microscopy, Materials Science Division, Lawrence Berkeley Laboratory, 1 Cyclotron Road, Berkeley, California 94720
J.S. Moya*
Affiliation:
National Center for Electron Microscopy, Materials Science Division, Lawrence Berkeley Laboratory, 1 Cyclotron Road, Berkeley, California 94720
*
a)Permanent address: INSA, GEMPPM, Bât. 502, u.a. CNRS 341, 69621 Villeurbanne Cedex, France.
b)Permanent address: Institutes de Ceramica y Vidrio (CSIC), Arganda del Rey, Madrid, Spain.
b)Permanent address: Institutes de Ceramica y Vidrio (CSIC), Arganda del Rey, Madrid, Spain.
Get access

Abstract

As part of a research program devoted to the microstructural characterization of Al2TiO5-based compounds, high resolution electron microscopy (HREM) has been undertaken in order to study the crystallographic arrangement, especially ordering possibilities, of Al and Ti cations in the metallic sublattice of aluminum titanate. It is seen that adequate experimental conditions, mainly defocus setting, for a resolution of at least 2.5 Å point-to-point, enable the disordered model to be directly and unambiguously proved on 100-oriented micrographs.

Type
Articles
Copyright
Copyright © Materials Research Society 1991

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1Bayer, G., J. Less-Common Metals 24, 129138 (1971).CrossRefGoogle Scholar
2Coene, W., Van Dyck, D., Van Landuyt, J., and Amelinckx, S., P hilos. Mag. B 56 (4), 415427 (1987).CrossRefGoogle Scholar
3Epicier, T., Blanchin, M. G., Ferret, P., and Fuchs, F., Philos. Mag. A 59 (4), 885906 (1989).CrossRefGoogle Scholar
4Epicier, T. A., Wohlfromm, H., and Thomas, G., Proc. 47th Ann. Meeting EMSA, edited by Bailey, G. W., San Francisco, CA, 422423 (1989).Google Scholar
5Glaisher, R. W., Spargo, A. E. G., and Smith, D. J., Ultramicrosc. 27, 1934 (1989).CrossRefGoogle Scholar
6Guan, R., Hashimoto, H., and Kuo, K. H., Ultramicrosc. 20, 195202 (1986).CrossRefGoogle Scholar
7Hamelin, M., Bull. Soc. Chim., 5° serie, 1559–1566 (1958).Google Scholar
8Hetherington, C. J. D., Nelson, E. C., Westmacott, K. H., Gronsky, R., and Thomas, G., in High Resolution Microscopy of Materials, edited by Krakow, W., Ponce, F. A., and Smith, D. J. (Mater. Res. Soc. Symp. Proc. 139, Pittsburgh, PA, 1989), pp. 277282.Google Scholar
9Hiraga, K., Shindo, D., and Hirabayashi, M., J. Appl. Cryst. 14, 169190 (1981).Google Scholar
10Howe, J. M., Basile, D. P., Prabhu, N., and Hatalis, M. K., Acta Cryst. A44, 449461 (1988).CrossRefGoogle Scholar
11Ishitsuka, M., Sato, T., Endo, T., and Shimada, M., J. Am. Ceram. Soc. 70 (2), 6971 (1987).CrossRefGoogle Scholar
12Kato, E., Daimon, K., and Takahashi, J., J. Am. Ceram. Soc. 63 (5), 355356 (1980).CrossRefGoogle Scholar
13Kilaas, R., in Proc. 45th Ann. Meeting EMSA, edited by Bailey, G. W., San Francisco, CA, 6669 (1987).Google Scholar
14Morosin, B. and Lynch, R. W., Acta Cryst. B28, 10401046 (1972).Google Scholar
15Ourmazd, A., Rentschler, J. R., and Taylor, D. W., Phys. Rev. Lett. 57 (24), 30733076 (1986).CrossRefGoogle Scholar
16Saxton, W. O., Pitt, T. J., and Homer, M., Ultramicrosc. 4, 343 (1979).Google Scholar
17Thomas, G., Hetherington, C. J. D., O'Keefe, M. A., Kilaas, R., Ramesh, R., and Epicier, T., in High Resolution Electron Microscopy of Defects in Materials, edited by Dahmen, U., Sinclair, R., and Smith, D. J. (Mater. Res. Soc. Symp. Proc. 183).Google Scholar
18Van Tendeloo, G., Van Dyck, D., and Amelinckx, S., Ultramicrosc. 19, 235252 (1986).Google Scholar
19Wohlfromm, H., Moya, J. S., and Pena, P., J. Mater. Sci. 25, 37533764 (1990).Google Scholar