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Analyzing and Expanding the Detector Efficiency of Silicon Drift Detectors

Published online by Cambridge University Press:  03 August 2008

A Niculae ,
H Soltau ,
P Lechner ,
G Lutz ,
A Bechteler ,
R Eckhardt ,
K Hermenau ,
A Liebel ,
O Jaritschin  and
A Simsek
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A Niculae
Affiliation:
PNSensor GmbH, Germany
H Soltau
Affiliation:
PNSensor GmbH, Germany
P Lechner
Affiliation:
PNSensor GmbH, Germany
G Lutz
Affiliation:
PNSensor GmbH, Germany
A Bechteler
Affiliation:
PNSensor GmbH, Germany
R Eckhardt
Affiliation:
PNSensor GmbH, Germany
K Hermenau
Affiliation:
PNSensor GmbH, Germany
A Liebel
Affiliation:
PNDetector GmbH, Germany
O Jaritschin
Affiliation:
PNDetector GmbH, Germany
A Simsek
Affiliation:
PNDetector GmbH, Germany
G Schaller
Affiliation:
Max-Planck Institute Halbleiterlabor, Germany
F Schopper
Affiliation:
Max-Planck Institute Halbleiterlabor, Germany
L Strüder
Affiliation:
Max-Planck Institute Halbleiterlabor, Germany
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 1170 - 1171
Copyright
© 2008 Microscopy Society of America

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