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AP Suite Extension Infrastructure

Published online by Cambridge University Press:  22 July 2022

James E Payne ,
David A. Reinhard ,
Tim R. Payne ,
Eric Strennen  and
Brian P. Geiser
James E Payne*
Affiliation:
CAMECA Instruments Inc., Madison, WI, USA
David A. Reinhard
Affiliation:
CAMECA Instruments Inc., Madison, WI, USA
Tim R. Payne
Affiliation:
CAMECA Instruments Inc., Madison, WI, USA
Eric Strennen
Affiliation:
CAMECA Instruments Inc., Madison, WI, USA
Brian P. Geiser
Affiliation:
CAMECA Instruments Inc., Madison, WI, USA
*
*Corresponding author: jim.payne@ametek.com

Abstract

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Type
Expanding the Limits of Atom Probe Tomography
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 730 - 731
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Copyright
Copyright © Microscopy Society of America 2022

References

Kühbach, M et al. , npj Comput Mater 7(21) (2021). https://doi.org/10.1038/s41524-020-00486-1CrossRefGoogle Scholar
Ghamarian, I and Marquis, EA, Ultramicroscopy 200 (2019), p. 28.10.1016/j.ultramic.2019.01.011CrossRefGoogle Scholar
Day, AC, Microsc. Microanal. 25 (2019), p. 338.10.1017/S1431927619002423CrossRefGoogle Scholar
Saxey, D, Ultramicroscopy 111 (2011), p. 473.10.1016/j.ultramic.2010.11.021CrossRefGoogle Scholar
CAMECA Instruments Inc. AP Suite User Guide. B2-B6 (2021)Google Scholar
Cameca Instruments, Inc. – Atom Probe Tomography, https://github.com/CamecaAPT (accessed Feb. 14, 2022)Google Scholar