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Application of the scanning ion-conductance microscopy (SICM) in study of voriconazole impact on Candida parapsilosis surface structure.

Published online by Cambridge University Press:  30 July 2021

Nikita Savin ,
Vasilii Kolmogorov ,
Roman Timoshenko ,
Alexander Vaneev ,
Aleksei Iakovlev ,
Oleg Suchalko ,
Natalia Grammatikova ,
Igor Levshin ,
Natalia Klyachko  and
Yurii Parkhomenko
...Show all authors
Nikita Savin
Affiliation:
National University of Science and Technology "MISIS", Moscow, Russia
Vasilii Kolmogorov
Affiliation:
National University of Science and Technology «MISiS», Moscow, Russia, Moskva, Russia
Roman Timoshenko
Affiliation:
National University of Science and Technology "MISIS", Moscow, Moskva, Russia
Alexander Vaneev
Affiliation:
National University of Science and Technology «MISiS», Russia
Aleksei Iakovlev
Affiliation:
National University of Science and Technology «MISiS», Moscow, Russia, Moskva, Russia
Oleg Suchalko
Affiliation:
National University of Science and Technology «MISiS», Moscow, Russia, Moskva, Russia
Natalia Grammatikova
Affiliation:
Gauze Research Institute for New Antibiotics, Moscow, Russian Federation, Russia
Igor Levshin
Affiliation:
Gauze Research Institute for New Antibiotics, Moscow, Russian Federation, Russia
Natalia Klyachko
Affiliation:
Lomonosov Moscow State University, Moscow, Russia, Russia
Yurii Parkhomenko
Affiliation:
NUST MISiS, Moscow, Russian Federation, Russia
Sergei Salikhov
Affiliation:
NUST MISiS, Moscow, Russian Federation, Russia
Alexander Majouga
Affiliation:
D. Mendeleev University of Chemical Technology, Russia
Alexander Erofeev
Affiliation:
National University of Science and Technology «MISiS», Moscow, Russia, Russia
Peter Gorelkin
Affiliation:
National University of Science and Technology «MISiS», Moscow, Russia, Russia
Yuri Korchev
Affiliation:
National University of Science and Technology "MISIS", Moscow, Russia

Abstract

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Type
3D Structures: From Macromolecular Assemblies to Whole Cells (3DEM FIG)
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 494 - 495
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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