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Applications of Phase-Contrast STEM as Dose Efficient Method for High-resolution Imaging of Soft Materials

Published online by Cambridge University Press:  30 July 2020

Roberto dos Reis ,
Anahita Pakzad ,
Paul Smeets  and
Vinayak Dravid
Roberto dos Reis
Affiliation:
Northwestern University, Evanston, Illinois, United States
Anahita Pakzad
Affiliation:
Gatan Inc, Pleasanton, California, United States
Paul Smeets
Affiliation:
Northwestern University, Evanston, Illinois, United States
Vinayak Dravid
Affiliation:
Northwestern University, Evanston, Illinois, United States

Abstract

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Type
Direct Phase Imaging with Coherent Electron Beam in TEM
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 2158 - 2160
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Copyright
Copyright © Microscopy Society of America 2020

References

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RdR thanks to Prof. Dr. William Dichtel, Prof. Dr. Nathan Gianneschi and Prof. Dr. Omar Farha groups at Northwestern University for providing COF and MOF samples for acquisition of ptychographic datasets. RdR and VPD thank Gatan Inc, for the loan period of K3 IS at NUANCE center. This work made use of the EPIC facility of Northwestern University's NUANCE Center, which has received support from the Soft and Hybrid Nanotechnology Experimental (SHyNE) Resource (NSF ECCS-1542205); the MRSEC program (NSF DMR-1720139) at the Materials Research Center; the International Institute for Nanotechnology (IIN); the Keck Foundation; and the State of Illinois.Google Scholar