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Approaches to Monitoring Structural Modification Using In Situ Electron Microscopy

Published online by Cambridge University Press:  22 July 2022

Thomas W. Hansen ,
William Bang Lomholdt ,
Matthew Helmi Leth Larsen ,
Cuauhtémoc Núñez Valencia ,
Jens Kling ,
Daniel Kelly ,
Pei Liu  and
Jakob Schiøtz
Thomas W. Hansen*
Affiliation:
DTU Nanolab, Technical University of Denmark, DK-2800, Kgs. Lyngby, Denmark
William Bang Lomholdt
Affiliation:
DTU Nanolab, Technical University of Denmark, DK-2800, Kgs. Lyngby, Denmark
Matthew Helmi Leth Larsen
Affiliation:
Department of Physics, Technical University of Denmark, DK-2800, Kgs. Lyngby, Denmark
Cuauhtémoc Núñez Valencia
Affiliation:
Department of Physics, Technical University of Denmark, DK-2800, Kgs. Lyngby, Denmark
Jens Kling
Affiliation:
DTU Nanolab, Technical University of Denmark, DK-2800, Kgs. Lyngby, Denmark
Daniel Kelly
Affiliation:
DTU Nanolab, Technical University of Denmark, DK-2800, Kgs. Lyngby, Denmark
Pei Liu
Affiliation:
DTU Nanolab, Technical University of Denmark, DK-2800, Kgs. Lyngby, Denmark
Jakob Schiøtz
Affiliation:
Department of Physics, Technical University of Denmark, DK-2800, Kgs. Lyngby, Denmark
*
*Corresponding author: thwh@dtu.dk

Abstract

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Type
Beyond Visualization with In Situ and Operando TEM
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 144 - 145
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Copyright
Copyright © Microscopy Society of America 2022

References

Liu, P., Madsen, J., Schiøtz, J. et al. , J. Phys.: Mater. 3 (2020), 024009.Google Scholar
Liu, P., Wu, T. T., Madsen, J. et al. , Nanoscale 11 (2019), 11885-11891.10.1039/C9NR02731ACrossRefGoogle Scholar
Madsen, J., Liu, P., Kling, J. et al. , Advanced Theory and Simulations 1 (2018), 12.10.1002/adts.201800037CrossRefGoogle Scholar
Madsen, J., Liu, P., Wagner, J. B. et al. , Adv. Struct. Chem. Imag. 3 (2017), 14.10.1186/s40679-017-0047-0CrossRefGoogle Scholar