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Atom Probe Tomography with the Easier to Operate EIKOS™

Published online by Cambridge University Press:  04 August 2017

Katherine P. Rice ,
Yimeng Chen ,
Robert M. Ulfig ,
Dan Lenz ,
Joseph Bunton ,
Mike van Dyke  and
David J. Larson
Katherine P. Rice
Affiliation:
CAMECA Instruments, Inc., 5470 Nobel Drive, Madison, WI 53711USA.
Yimeng Chen
Affiliation:
CAMECA Instruments, Inc., 5470 Nobel Drive, Madison, WI 53711USA.
Robert M. Ulfig
Affiliation:
CAMECA Instruments, Inc., 5470 Nobel Drive, Madison, WI 53711USA.
Dan Lenz
Affiliation:
CAMECA Instruments, Inc., 5470 Nobel Drive, Madison, WI 53711USA.
Joseph Bunton
Affiliation:
CAMECA Instruments, Inc., 5470 Nobel Drive, Madison, WI 53711USA.
Mike van Dyke
Affiliation:
CAMECA Instruments, Inc., 5470 Nobel Drive, Madison, WI 53711USA.
David J. Larson
Affiliation:
CAMECA Instruments, Inc., 5470 Nobel Drive, Madison, WI 53711USA.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 42 - 43
Copyright
© Microscopy Society of America 2017 

References

[1] Bajikar, S. S., et al, Appl. Surf. Sci 94/95 1996). p. 464.Google Scholar
[2] Larson, D.J., et al, Local Electrode Atom Probe Tomography. Springer New York 2013.Google Scholar
[3] Schlesiger, R., et al, Review of Scientific Instruments 81 2010). p. 043703.Google Scholar