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Atomic-scale Mechanisms of Defect-Induced Retention Failure in Ferroelectric Materials
Published online by Cambridge University Press: 23 September 2015
Abstract
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- Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1307 - 1308
- Copyright
- Copyright © Microscopy Society of America 2015
References
References:
[2]. The authors gratefully acknowledge the financial support through DOE grant DoE/BES DE-FG02-07ER46416..Google Scholar