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Automated mapping of the crystallographic sample orientation from diffraction patterns in momentum-resolved STEM

Published online by Cambridge University Press:  30 July 2021

Mauricio Cattaneo ,
Knut Müller-Caspary ,
Juri Barthel ,
Katherine MacArthur  and
Marta Lipinska-Chwalek
Mauricio Cattaneo
Affiliation:
Ernst Ruska Centre for Microscopy and Spectroscopy with Electrons and the Peter Grünberg Institute Forschungszentrum Jülich, 52425Jülich, Germany, United States
Knut Müller-Caspary
Affiliation:
Ernst Ruska Centre for Microscopy and Spectroscopy with Electrons and the Peter Grünberg Institute Forschungszentrum Jülich, 52425Jülich, Germany, United States
Juri Barthel
Affiliation:
Ernst Ruska Centre for Microscopy and Spectroscopy with Electrons and the Peter Grünberg Institute Forschungszentrum Jülich, 52425Jülich, Germany, United States
Katherine MacArthur
Affiliation:
Ernst Ruska Centre for Microscopy and Spectroscopy with Electrons and the Peter Grünberg Institute Forschungszentrum Jülich, 52425Jülich, Germany, Germany
Marta Lipinska-Chwalek
Affiliation:
Ernst Ruska Centre for Microscopy and Spectroscopy with Electrons and the Peter Grünberg Institute Forschungszentrum Jülich, 52425Jülich, Germany, United States

Abstract

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Type
Advanced Imaging and Spectroscopy for Nanoscale Materials Characterization
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1444 - 1445
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Grieb, T. et al. , Ultramicroscopy 190 (2018)CrossRefGoogle Scholar
MacArthur, K.E. et al. , Microsc. & Microanal. AcceptedGoogle Scholar
Funding: Jülich Melbourne Postgraduate Academy (JUMPA, M.C.), Helmholtz Contract VH-NG-1317 (K. M-C.), DFG HE 7192/1-2 (K. M.). EMPAD data has been recorded within a cooperation with Thermo Fisher Scientific, Inc.Google Scholar