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Benefits and Possibilities of Cc–Correction for TEM / STEM

Published online by Cambridge University Press:  01 November 2002

Heiko Mülle ,
Stephan Uhlemann  and
Maximilian Haider
Heiko Mülle
Affiliation:
CEOS GmbH, Engler Straße 28, 69126 Heidelberg, Germany
Stephan Uhlemann
Affiliation:
CEOS GmbH, Engler Straße 28, 69126 Heidelberg, Germany
Maximilian Haider
Affiliation:
CEOS GmbH, Engler Straße 28, 69126 Heidelberg, Germany

Abstract

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Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 12 - 13
Copyright
Copyright © Microscopy Society of America 2002