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Cathodoluminescence Hyperspectral Imaging of Nitride Semiconductors: Introducing New Variables

Published online by Cambridge University Press:  27 August 2014

Paul R. Edwards ,
Michael J. Wallace ,
Gunnar Kusch ,
Gunasekar Naresh-Kumar ,
Jochen Bruckbauer ,
Carol Trager-Cowan ,
Kevin P. O’Donnell  and
Robert W. Martin
Paul R. Edwards
Affiliation:
Department of Physics, SUPA, University of Strathclyde, Glasgow, Scotland, United Kingdom
Michael J. Wallace
Affiliation:
Department of Physics, SUPA, University of Strathclyde, Glasgow, Scotland, United Kingdom
Gunnar Kusch
Affiliation:
Department of Physics, SUPA, University of Strathclyde, Glasgow, Scotland, United Kingdom
Gunasekar Naresh-Kumar
Affiliation:
Department of Physics, SUPA, University of Strathclyde, Glasgow, Scotland, United Kingdom
Jochen Bruckbauer
Affiliation:
Department of Physics, SUPA, University of Strathclyde, Glasgow, Scotland, United Kingdom
Carol Trager-Cowan
Affiliation:
Department of Physics, SUPA, University of Strathclyde, Glasgow, Scotland, United Kingdom
Kevin P. O’Donnell
Affiliation:
Department of Physics, SUPA, University of Strathclyde, Glasgow, Scotland, United Kingdom
Robert W. Martin
Affiliation:
Department of Physics, SUPA, University of Strathclyde, Glasgow, Scotland, United Kingdom

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 906 - 907
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Edwards, P. R., Martin, R. W. Semiconductor Science and Technology 26 (2011), p. 064005.Google Scholar
[2] Edwards, P. R., et al, Physica Status Solidi C 0 (2003), p. 2474.Google Scholar
[3] MacRae, C. M., et al, Microscopy and Microanalysis 18 (2012), p. 1239.Google Scholar
[4] Naresh-Kumar, G., et al, Microscopy and Microanalysis 20 ( (2014), p. 55; see also abstract by C. Trager-Cowan et al, this volume.Google Scholar
[5] Wallace, M. J., et al, submitted (07 Feb (2014) to Journal of Applied Physics.Google Scholar
[6] Kusch, G., et al, submitted (18 Dec (2013) to Applied Physics Letters.Google Scholar
[7] This work was funded by the U.K. Engineering and Physical Sciences Research Council. The authors gratefully acknowledge the provision of samples by the Tyndall National Institute (Republic of Ireland), the University of Cambridge (U.K.) and the University of Bath (U.K.).Google Scholar