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Controlled Light Exposure Microscopy (CLEM) for prolonged live-cell imaging and strongly reduced photobleaching

Published online by Cambridge University Press:  03 August 2008

R Hoebe ,
W de Vos ,
C van Oven ,
P Zoon ,
S Lambrechts ,
P van Oostveldt ,
D Gadella ,
R van Noorden  and
E Manders
R Hoebe
Affiliation:
University of Amsterdam, The Netherlands
W de Vos
Affiliation:
Ghent University, Belguim
C van Oven
Affiliation:
University of Amsterdam, The Netherlands
P Zoon
Affiliation:
University of Amsterdam, The Netherlands
S Lambrechts
Affiliation:
University of Amsterdam, The Netherlands
P van Oostveldt
Affiliation:
Ghent University, Belguim
D Gadella
Affiliation:
University of Amsterdam, The Netherlands
R van Noorden
Affiliation:
University of Amsterdam, The Netherlands
E Manders
Affiliation:
University of Amsterdam, The Netherlands
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 718 - 719
Copyright
© 2008 Microscopy Society of America

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