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Correlation of Strain and Elemental Distribution at the Interface Using Simultaneous Energy-Filtered High-Speed 4D STEM Diffraction Imaging and EDS

Published online by Cambridge University Press:  01 August 2018

Anahita Pakzad  and
Paolo Longo
Anahita Pakzad
Affiliation:
Gatan Inc., Pleasanton, CA, USA
Paolo Longo
Affiliation:
Gatan Inc., Pleasanton, CA, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 168 - 169
Copyright
© Microscopy Society of America 2018 

References

[1] We would like to thank Dr. Gianluigi Botton from McMaster University for providing the sample and helpful discussions on this work.Google Scholar