Hostname: page-component-848d4c4894-mwx4w Total loading time: 0 Render date: 2024-06-17T10:19:16.285Z Has data issue: false hasContentIssue false
  • English
  • Français

Depth Dependence of the Photoelectron Emission Profile for Cathode Lens Microscopy

Published online by Cambridge University Press:  10 August 2018

Yen Huang ,
Tzu-Hung Chuang ,
Chun-I Lu ,
Chih-Heng Huang ,
Deng-Sung Lin ,
Chien-Chen Kuo  and
Der-Hsin Wei
Yen Huang
Affiliation:
Graduate Program of Science and Technology of Synchrotron Light Source, National Tsing Hua University, Hsinchu, Taiwan National Synchrotron Radiation Research Center, Hsinchu, Taiwan
Tzu-Hung Chuang
Affiliation:
National Synchrotron Radiation Research Center, Hsinchu, Taiwan
Chun-I Lu
Affiliation:
National Synchrotron Radiation Research Center, Hsinchu, Taiwan
Chih-Heng Huang
Affiliation:
Program of Synchrotron Radiation and Neutron Beam Applications, National Sun Yat-sen University, Kaohsiung, Taiwan
Deng-Sung Lin
Affiliation:
Graduate Program of Science and Technology of Synchrotron Light Source, National Tsing Hua University, Hsinchu, Taiwan Department of Physics, National Tsing Hua University, Hsinchu, Taiwan
Chien-Chen Kuo
Affiliation:
Program of Synchrotron Radiation and Neutron Beam Applications, National Sun Yat-sen University, Kaohsiung, Taiwan
Der-Hsin Wei*
Affiliation:
Graduate Program of Science and Technology of Synchrotron Light Source, National Tsing Hua University, Hsinchu, Taiwan National Synchrotron Radiation Research Center, Hsinchu, Taiwan Program of Synchrotron Radiation and Neutron Beam Applications, National Sun Yat-sen University, Kaohsiung, Taiwan
*
* Corresponding author, dhw@nsrrc.org.tw

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 154 - 155
Copyright
© Microscopy Society of America 2018 

References

[1] Feng, J., etal, J. Phys.: Condensed Matter 17 2005 S1339.Google Scholar
[2] Th., Schmidt, et al, Ultramicroscopy 126 2013 23.Google Scholar
[3] Seah, M. P. Dench, W. A. Surf. Interface Anal. 1 1979 2.Google Scholar
[4] Patt, M., et al, Rev. Sci. Instrum. 85 2014 113704.CrossRefGoogle Scholar