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Determining Interplanar Distances from STEM-EDX Hyperspectral Maps

Published online by Cambridge University Press:  25 July 2016

Jeffrey Ditto ,
Gavin Mitchson ,
Devin R. Merrill ,
Douglas L. Medlin ,
Nigel D. Browning  and
David C. Johnson
Jeffrey Ditto
Affiliation:
University of Oregon, Department of Chemistry, Eugene, OR, USA
Gavin Mitchson
Affiliation:
University of Oregon, Department of Chemistry, Eugene, OR, USA
Devin R. Merrill
Affiliation:
University of Oregon, Department of Chemistry, Eugene, OR, USA
Douglas L. Medlin
Affiliation:
Sandia National Laboratories, Energy Nanomaterials Department, Livermore, CA, USA
Nigel D. Browning
Affiliation:
Pacific Northwest National Laboratories, Fundamental and Computational Sciences Directorate, Richland, WA, USA
David C. Johnson
Affiliation:
University of Oregon, Department of Chemistry, Eugene, OR, USA

Abstract

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Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 944 - 945
Copyright
© Microscopy Society of America 2016 

References

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[9] The authors acknowledge funding from National Science Foundation under grant DMR-1266217. Coauthors MF and SB acknowledge support from the National Science Foundation through CCI grant number CHE-1102637. Sandia National Laboratories is a multi-program laboratory managed and operated by Sandia Corporation, a wholly owned subsidiary of Lockheed Martin Corporation, for the U.S. Department of Energy’s National Nuclear Security Administration under contract DE-AC0494AL85000. We acknowledge support through the Collaborative Access Team (CAT): Pooled Resources for Electron Microscopy Informatics, Education and Research (PREMIER) Network Program and the Chemical Imaging Initiative at Pacific Northwest National Laboratory (PNNL) and the Environmental Molecular Sciences Laboratory, a national scientific user facility sponsored by DOE's Office of Biological and Environmental Research at PNNL. PNNL is a multiprogram national laboratory operated by Battelle for DOE under Contract DE-AC05-76RL01830.Google Scholar