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Development of Soft X-ray Microanalysis using Windowless SDD Technology

Published online by Cambridge University Press:  27 August 2014

S. Burgess ,
X. Li ,
J. Holland ,
P. Statham ,
S. Bhadare ,
D. Birtwistle  and
A. Protheroe

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 898 - 899
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Terauchi, M., et al. (2011) Journal of Electron Microscopy, 61 (1), 1– 8.Google Scholar
[2] Burgess, S., et al. (2013) Microscopy and Analysis, 27 (4), S8-S13. (EU).Google Scholar