A Double Silicon Drift Type Detector System for EDS with Ultrahigh Efficiency and Throughput for TEM

S. Kawai; I. Onishi; T. Ishikawa; K. Yagi; T. Iwama; K. Miyatake; Y. Iwasawa; M. Matsushita; T. Kaneyama; Y. Kondo

doi:10.1017/S143192761400748X

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A Double Silicon Drift Type Detector System for EDS with Ultrahigh Efficiency and Throughput for TEM

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