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Dynamic observation of electro-assisted Fe oxidation by Operando Atom Probe

Published online by Cambridge University Press:  22 July 2022

Sten V. Lambeets ,
Naseeha Cardwell ,
Isaac Onyango ,
Mark G. Wirth ,
Janet Teng ,
Graham J. Orren ,
Arun Devaraj ,
Thierry Visart de Bocarme ,
Jean-Sabin McEwen  and
Daniel E. Perea
Sten V. Lambeets
Affiliation:
Environmental Molecular Sciences Laboratory–Pacific Northwest National Laboratory, Richland, WA, USA Physical and Computational Sciences Directorate–Pacific Northwest National Laboratory, Richland, WA, USA
Naseeha Cardwell
Affiliation:
School of Chemical Engineering and Bioengineering–Washington State University, Pullman, WA, USA
Isaac Onyango
Affiliation:
School of Chemical Engineering and Bioengineering–Washington State University, Pullman, WA, USA
Mark G. Wirth
Affiliation:
Environmental Molecular Sciences Laboratory–Pacific Northwest National Laboratory, Richland, WA, USA
Janet Teng
Affiliation:
Environmental Molecular Sciences Laboratory–Pacific Northwest National Laboratory, Richland, WA, USA
Graham J. Orren
Affiliation:
Environmental Molecular Sciences Laboratory–Pacific Northwest National Laboratory, Richland, WA, USA
Arun Devaraj
Affiliation:
School of Chemical Engineering and Bioengineering–Washington State University, Pullman, WA, USA
Thierry Visart de Bocarme
Affiliation:
Universite Libre de Bruxelles, Brussels, Belgium
Jean-Sabin McEwen
Affiliation:
Environmental Molecular Sciences Laboratory–Pacific Northwest National Laboratory, Richland, WA, USA School of Chemical Engineering and Bioengineering–Washington State University, Pullman, WA, USA
Daniel E. Perea
Affiliation:
Environmental Molecular Sciences Laboratory–Pacific Northwest National Laboratory, Richland, WA, USA

Abstract

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Type
Expanding the Limits of Atom Probe Tomography
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 724 - 725
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Copyright
Copyright © Microscopy Society of America 2022

References

Lambeets, SV et al. , J. Phys Chem. Lett. 11 (2020), p. 3144.10.1021/acs.jpclett.0c00321CrossRefGoogle Scholar
Lambeets, SV et al. , Top Catal 63 (2020), p. 1606.10.1007/s11244-020-01367-zCrossRefGoogle Scholar
Gault, B et al. in “Atom Probe Microscopy”, ed. Springer (New York Heidelberg Dordrecht London)Google Scholar
Müller, EW in “Field ion microscopy principles and applications, 1st Edition”, (Elsevier Publishing Company Inc., New York, USA).Google Scholar