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The Effect of Nonuniform Pixel Responses in CCD on Quantitative Analysis

Published online by Cambridge University Press:  05 August 2019

BinBin Wang ,
Bryan D. Esser ,
Nuria Bagués ,
Jiaqiang Yan ,
Ari N. Blumer  and
David W. McComb
BinBin Wang
Affiliation:
Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, OHUSA. Dept. of Materials Science & Engineering, The Ohio State University, Columbus, OH, USA
Bryan D. Esser
Affiliation:
Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, OHUSA.
Nuria Bagués
Affiliation:
Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, OHUSA.
Jiaqiang Yan
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, TN 37831, USA
Ari N. Blumer
Affiliation:
Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, OHUSA. Dept. of Materials Science & Engineering, The Ohio State University, Columbus, OH, USA
David W. McComb*
Affiliation:
Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, OHUSA. Dept. of Materials Science & Engineering, The Ohio State University, Columbus, OH, USA
*
*Corresponding author: mccomb.29@osu.edu

Abstract

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Type
Data Acquisition Schemes, Machine Learning Algorithms, and Open Source Software Development for Electron Microscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 230 - 231
Copyright
Copyright © Microscopy Society of America 2019 

References

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