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Excellent Performance with 100 mm² Silicon Drift Detectors

Published online by Cambridge University Press:  01 August 2010

H Soltau ,
R Eckhardt ,
O Jaritschin ,
S Jeschke ,
P Lechner ,
A Liebel ,
G Lutz ,
A Niculae ,
G Schaller  and
F Schopper
...Show all authors
H Soltau
Affiliation:
PNSensor GmbH, Germany
R Eckhardt
Affiliation:
PNSensor GmbH, Germany
O Jaritschin
Affiliation:
PNDetector GmbH, Germany
S Jeschke
Affiliation:
PNSensor GmbH, Germany
P Lechner
Affiliation:
PNSensor GmbH, Germany
A Liebel
Affiliation:
PNDetector GmbH, Germany
G Lutz
Affiliation:
PNSensor GmbH, Germany
A Niculae
Affiliation:
PNDetector GmbH, Germany
G Schaller
Affiliation:
Max-Planck-Institut Halbleiterlabor, Germany
F Schopper
Affiliation:
Max-Planck-Institut Halbleiterlabor, Germany
A Simsek
Affiliation:
PNDetector GmbH, Germany
L Strüder
Affiliation:
Max-Planck-Institut Halbleiterlabor, Germany
O Zimmer
Affiliation:
Technische Universität München, Germany;

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1306 - 1307
Copyright
Copyright © Microscopy Society of America 2010