Hostname: page-component-848d4c4894-wg55d Total loading time: 0 Render date: 2024-06-08T23:21:12.601Z Has data issue: false hasContentIssue false
  • English
  • Français

Expanding Capabilities of Low-kV STEM Imaging and Transmission Electron Diffraction in FIB/SEM Systems

Published online by Cambridge University Press:  04 August 2017

Tomáš Vystavěl ,
Lubomír Tůma ,
Pavel Stejskal ,
Marek Unčovský ,
Jan Skalický  and
Richard Young
Tomáš Vystavěl
Affiliation:
Thermo Fisher Scientific, Vlastimila Pecha 12, Brno, Czech Republic
Lubomír Tůma
Affiliation:
Thermo Fisher Scientific, Vlastimila Pecha 12, Brno, Czech Republic
Pavel Stejskal
Affiliation:
Thermo Fisher Scientific, Vlastimila Pecha 12, Brno, Czech Republic
Marek Unčovský
Affiliation:
Thermo Fisher Scientific, Vlastimila Pecha 12, Brno, Czech Republic
Jan Skalický
Affiliation:
Thermo Fisher Scientific, Vlastimila Pecha 12, Brno, Czech Republic
Richard Young
Affiliation:
Thermo Fisher Scientific, 5350 NE Dawson Creek Drive, Hillsboro, OR, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 554 - 555
Copyright
© Microscopy Society of America 2017 

References

[1] Kaiser, U & Stöger-Pollach, M Ultramicroscopy 145 2014). p. 1.Google Scholar
[2] Vystavel, , et al, Microscopy and Microanalysis 22(S3 2016). p. 30.CrossRefGoogle Scholar
[3] http://medipix.web.cern.ch/medipix/.Google Scholar