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Exploring Differences in Amorphous Layer Formation during FIB Sample Preparation between Metals and Non Metals

Published online by Cambridge University Press:  25 July 2016

Michael Presley ,
Jacob Jensen ,
Dan Huber  and
Hamish Fraser
Michael Presley
Affiliation:
Center for the Accelerated Maturation of Materials, The Ohio State University, Columbus OH
Jacob Jensen
Affiliation:
Center for the Accelerated Maturation of Materials, The Ohio State University, Columbus OH
Dan Huber
Affiliation:
Center for the Accelerated Maturation of Materials, The Ohio State University, Columbus OH
Hamish Fraser
Affiliation:
Center for the Accelerated Maturation of Materials, The Ohio State University, Columbus OH

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 144 - 145
Copyright
© Microscopy Society of America 2016 

References

[1] Rajsiri, S., etal, Microsc. Microanal 8(Suppl. 2 (2002) 50–51.Google Scholar
[2] Kato, N. Journal of Electron Microscopy 53 (2004) 451–458.CrossRefGoogle Scholar