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Formation mechanism of dominant kinks in GaP nanowires grownin an in-situ (S)TEM gas cell holder investigatedby SPED and SNBED

Published online by Cambridge University Press:  30 July 2021

David Krug ,
Maximilian Widemann ,
Shamail Ahmed ,
Felix Gruber ,
Andreas Beyer  and
Kerstin Volz
David Krug
Affiliation:
Materials Science Centre and Department of Physics, Philipps University Marburg, Hans-Meerwein-Straße 6, Marburg, 35032, Germany, United States
Maximilian Widemann
Affiliation:
Materials Science Centre and Department of Physics, Philipps University Marburg, Hans-Meerwein-Straße 6, Marburg, 35032, Germany, Marburg, Hessen, United States
Shamail Ahmed
Affiliation:
STRL, University of Marburg, United States
Felix Gruber
Affiliation:
Materials Science Centre and Department of Physics, Philipps University Marburg, Hans-Meerwein-Straße 6, Marburg, 35032, Germany, United States
Andreas Beyer
Affiliation:
Materials Science Centre and Department of Physics, Philipps University Marburg, Hans-Meerwein-Straße 6, Marburg, 35032, Germany, Germany
Kerstin Volz
Affiliation:
Materials Science Centre and Department of Physics, Philipps University Marburg, Hans-Meerwein-Straße 6, Marburg, 35032, Germany, Germany

Abstract

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Type
New Frontiers in In-Situ Electron Microscopy in Liquids and Gases (L&G EM FIG Sponsored)
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 2228 - 2230
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Yan, R., et al. , Nature Photonics 3 (2009), pp. 569-576.CrossRefGoogle Scholar
Allard, L. F., et al. , Microscopy and Microanalysis 18 4 (2012), pp. 656-666.CrossRefGoogle Scholar
Straubinger, R., et al. , Microscopy and Microanalysis 23 4 (2017), pp. 751-757.CrossRefGoogle Scholar
Wagner, R. S., Ellis, W. C., Applied Physics Letters 4 (1964), pp. 89.Google Scholar
Rauch, E., et al. , Z. Kristallogr. 225 (2010) pp. 103-109.CrossRefGoogle Scholar