Hostname: page-component-848d4c4894-m9kch Total loading time: 0 Render date: 2024-06-04T07:29:32.105Z Has data issue: false hasContentIssue false
  • English
  • Français

From Control of the Electron Beam to Control of Single Atoms

Published online by Cambridge University Press:  05 August 2019

Andrew R. Lupini ,
Bethany M. Hudak ,
Stephen Jesse ,
Jiaming Song ,
Ondrej Dyck ,
Paul C. Snijders  and
Sergei V. Kalinin
Andrew R. Lupini*
Affiliation:
The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA. The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA.
Bethany M. Hudak
Affiliation:
The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA.
Stephen Jesse
Affiliation:
The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA. The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA.
Jiaming Song
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA.
Ondrej Dyck
Affiliation:
The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA. The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA.
Paul C. Snijders
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA.
Sergei V. Kalinin
Affiliation:
The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA. The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA.
*
*Corresponding author: arl1000@ornl.gov

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Revealing the Fundamental Structure of Soft and Hard Matter by Minimizing Beam-Sample Interactions
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1678 - 1679
Copyright
Copyright © Microscopy Society of America 2019 

Footnotes

#

Present address: School of Physics, Northwest University, Xi'an, China.

References

[1]Krivanek, OL et al. , Nature 464 (2010).Google Scholar
[2]Dellby, N et al. , J. Electron Microsc. 50 (2001), p. 177.Google Scholar
[3]Sang, X et al. , Scientific Reports 7 (2017).Google Scholar
[4]Jesse, S et al. , Small 11 (2015), p. 5895.Google Scholar
[5]Jesse, S et al. , Nanotechnology 29 (2019), p. 255303.Google Scholar
[6]Susi, T et al. , Ultramicroscopy 180 (2017), p. 163.Google Scholar
[7]Dyck, O et al. , Applied Physics Letters 111 (2017), p. 113104.Google Scholar
[8]Ishikawa, R. et al. , Phys Rev Lett 113 (15) (2014).Google Scholar
[9]Hudak, BM et al. , ACS Nano 12 (2018), p. 5873.Google Scholar
[10]Work supported by the U.S. Department of Energy, Office of Science, Basic Energy Sciences, Division of Materials Science and Engineering, and by the Laboratory Directed Research and Development Program of Oak Ridge National Laboratory, managed by UT-Battelle, LLC for the U.S. Department of Energy, and was performed at the Oak Ridge National Laboratory's Center for Nanophase Materials Sciences (CNMS), a U.S. Department of Energy Office of Science User Facility.Google Scholar