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High energy resolution EELS using a monochromized 200 kV TEM: Comparative investigation of titanium oxides

Published online by Cambridge University Press:  05 September 2003

Christoph Mitterbauer ,
Gerald Kothleitner ,
Ferdinand Hofer ,
Peter C. Tiemeijer ,
Bert H. Freitag  and
Henny W. Zandbergen
Christoph Mitterbauer
Affiliation:
Research Institute for Electron Microscopy, Graz University of Technology, A-8010 Graz, Austria
Gerald Kothleitner
Affiliation:
Research Institute for Electron Microscopy, Graz University of Technology, A-8010 Graz, Austria
Ferdinand Hofer
Affiliation:
Research Institute for Electron Microscopy, Graz University of Technology, A-8010 Graz, Austria
Peter C. Tiemeijer
Affiliation:
FEI Electron Optics, P O Box 218, 5600 MD Eindhoven, The Netherlands
Bert H. Freitag
Affiliation:
FEI Electron Optics, P O Box 218, 5600 MD Eindhoven, The Netherlands
Henny W. Zandbergen
Affiliation:
Laboratory of Materials Science, Centre for HREM, Delft University of Technology, Rotterdamseweg 137, 2628 AL Delft, The Netherlands
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Abstract

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Type
Invited Papers
Information
Microscopy and Microanalysis , Volume 9 , Issue S03 , September 2003 , pp. 86 - 87
Copyright
Copyright © Microscopy Society of America 2003

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