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In situ Imaging of Materials using X-ray Tomography

Published online by Cambridge University Press:  01 August 2018

Brian M. Patterson ,
Nikolaus L. Cordes ,
Kevin Henderson ,
Xianghui Xiao  and
Nikhilesh Chawla
Brian M. Patterson
Affiliation:
Materials Science and Technology Division, Engineered Materials Group, Los Alamos National Laboratory, Los Alamos, NM, USA
Nikolaus L. Cordes
Affiliation:
Materials Science and Technology Division, Engineered Materials Group, Los Alamos National Laboratory, Los Alamos, NM, USA
Kevin Henderson
Affiliation:
Materials Science and Technology Division, Engineered Materials Group, Los Alamos National Laboratory, Los Alamos, NM, USA
Xianghui Xiao
Affiliation:
X-ray Photon Sciences, Argonne National Laboratory, Argonne, IL, USA
Nikhilesh Chawla
Affiliation:
4D Materials Science Center, Arizona State University, Tempe, AZ

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1002 - 1003
Copyright
© Microscopy Society of America 2018 

References

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[4] Patterson, B.M., et. al., Microscopy and Microanalysis 95 2014 18–26.Google Scholar
[5] Mertens, J.C.E., et. al., Journal of Materials Science 52(20 2017 12185–12206.Google Scholar
[6] Patterson, B.M., et. al., Journal of Material Science 51(1 2016 171–187.Google Scholar