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Increasing the Speed of EELS/EDS Mapping Through Dynamic/Adaptive Sampling Methodologies

Published online by Cambridge University Press:  01 August 2018

Karl A. Hujsak ,
Andrew Stevens ,
Libor Kovarik ,
Andrey Liyu ,
Nigel D. Browning  and
Vinayak P. Dravid
Karl A. Hujsak
Affiliation:
Department of Materials Science & Engineering, Northwestern University, Evanston, IL
Andrew Stevens
Affiliation:
OptimalSensing, Southlake, TX Department of Electrical and Computer Engineering, Duke University, Durham, NC
Libor Kovarik
Affiliation:
Pacific Northwest National Laboratory, Richland, WA
Andrey Liyu
Affiliation:
Pacific Northwest National Laboratory, Richland, WA
Nigel D. Browning
Affiliation:
Pacific Northwest National Laboratory, Richland, WA Department of Materials Engineering, University of Liverpool, Liverpool, United Kingdom
Vinayak P. Dravid
Affiliation:
Department of Materials Science & Engineering, Northwestern University, Evanston, IL Electron Probe Instrumentation Center (EPIC) Facility, NUANCE Center, Northwestern University, Evanston, IL

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 484 - 485
Copyright
© Microscopy Society of America 2018 

References

[1] Hujsak, K., et al, M&M 2016) p. 1.Google Scholar
[2] Stevens, A., et al. (2018) Applied Physics Letters 112(4 2018) p. 043104.Google Scholar
[3] Godaliyadda, G.M., et al, Electronic Imaging 2016 19 2016) p. 1.Google Scholar
[4] This material is based on research sponsored by the Air Force Research laboratory under agreement No. FA8650-15-2-5518 and Air Force Office of Scientific Research under Award No. FA9550- 12-1-0280. This work made use of the EPIC facility of Northwestern University's NUANCE Center, which has received support from the Soft and Hybrid Nanotechnology Experimental (SHyNE) Resource (NSF ECCS-1542205); the MRSEC program (NSF DMR-1720139) at the Materials Research Center; the International Institute for Nanotechnology (IIN); the Keck Foundation; and the State of Illinois.Google Scholar