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Layer Stacking Determination in Topological Semimetal MoTe2 via STEM Imaging, Liquid He TEM, and Quantitative Electron Diffraction

Published online by Cambridge University Press:  22 July 2022

James L Hart
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY, United States Energy Sciences Institute, Yale University, New Haven, CT, United States
Lopa Bhatt
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, United States
Myung-Geun Han
Affiliation:
Condensed Matter Physics and Materials Science Department, Brookhaven National Laboratory, Upton, NY, United States
David Hynek
Affiliation:
Energy Sciences Institute, Yale University, New Haven, CT, United States
John A Schneeloch
Affiliation:
Department of Physics, University of Virginia, Charlottesville, VA, United States
Yu Tao
Affiliation:
Department of Physics, University of Virginia, Charlottesville, VA, United States
Despina Louca
Affiliation:
Department of Physics, University of Virginia, Charlottesville, VA, United States
Yimei Zhu
Affiliation:
Condensed Matter Physics and Materials Science Department, Brookhaven National Laboratory, Upton, NY, United States
Lena F Kourkoutis
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, United States Kavli Institute at Cornell for Nanoscale Science, Cornell University, Ithaca, NY, United States
Judy J Cha*
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY, United States Energy Sciences Institute, Yale University, New Haven, CT, United States
*
*Corresponding author: jc476@cornell.edu

Abstract

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Type
Quantum Materials Under Electron Beam: From Atomic Structures to Working Devices
Copyright
Copyright © Microscopy Society of America 2022

References

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