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Leveraging Hybrid Pixel Electron Detection Technology to Expand Electron Microscopy Observation of Material Structures at low Voltages

Published online by Cambridge University Press:  30 July 2021

Anahita Pakzad  and
Roberto dos Reis
Anahita Pakzad
Affiliation:
Gatan Inc., United States
Roberto dos Reis
Affiliation:
Department of Materials Science and Engineering, Northwestern University, United States

Abstract

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Type
Diffraction Imaging Across Disciplines
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1000 - 1002
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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RdR acknowledges the support of the EPIC facility of Northwestern University's NUANCE Center, which has received support from the SHyNE Resource (NSF ECCS-2025633), the IIN, and Northwestern's MRSEC program (NSF DMR-1720139). This research was supported in part through the computational resources and staff contributions provided for the Quest high performance computing facility at Northwestern University which is jointly supported by the Office of the Provost, the Office for Research, and Northwestern University Information Technology.Google Scholar