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Mapping Anti-phase Domains by Polarity Sensitive Orientation Imaging Using Electron Backscatter Diffraction
Published online by Cambridge University Press: 04 August 2017
Abstract
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- Type
- Abstract
- Information
- Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1522 - 1523
- Copyright
- © Microscopy Society of America 2017
References
[2]
Nolze, G., Grosse, C. & Winkelmann, A.
Journal of Applied Crystallography
48
2015). p. 1405.CrossRefGoogle Scholar