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Measuring 3D Chemistry with Fused Multi-Modal Electron Tomography

Published online by Cambridge University Press:  22 July 2022

Jonathan Schwartz ,
Jacob Pietryga ,
Jonathan Rowell ,
Jeffrey A. Fessler ,
Steve Rozeveld ,
Yi Jiang ,
Zichao Wendy Di ,
Richard Robinson  and
Robert Hovden
Jonathan Schwartz
Affiliation:
Department of Materials Science and Engineering, University of Michigan, Ann Arbor, MI.
Jacob Pietryga
Affiliation:
Department of Materials Science and Engineering, University of Michigan, Ann Arbor, MI. Department of Material Science and Engineering, Northwestern University, Evanston, IL.
Jonathan Rowell
Affiliation:
Department of Material Science and Engineering, Cornell University, Ithaca, NY.
Jeffrey A. Fessler
Affiliation:
Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI.
Steve Rozeveld
Affiliation:
Dow Chemical Co., Midland, MI.
Yi Jiang
Affiliation:
Advanced Photon Source, Argonne National Laboratory, Lemont, IL.
Zichao Wendy Di
Affiliation:
Mathematics and Computer Science Division, Argonne National Laboratory, Lemont, IL.
Richard Robinson
Affiliation:
Department of Material Science and Engineering, Cornell University, Ithaca, NY.
Robert Hovden
Affiliation:
Department of Materials Science and Engineering, University of Michigan, Ann Arbor, MI. Applied Physics Program, University of Michigan, Ann Arbor, MI.

Abstract

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Type
Advanced Imaging and Spectroscopy for Nanoscale Materials
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2622 - 2624
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Copyright
Copyright © Microscopy Society of America 2022

References

Weyland, M. & Midgley, P. Microsc. Microanal. 9, 542 (2003).Google Scholar
Yurtsever, A., Weyland, M. & Muller, D. Appl. Phys. Lett. 89 (2006).CrossRefGoogle Scholar
Schwartz, J., et al. npj Comput. Mater. 8, 16 (2022).CrossRefGoogle Scholar
Ha, D., et al. Nano Lett. 14, 7090 (2014).CrossRefGoogle Scholar