Hostname: page-component-848d4c4894-m9kch Total loading time: 0 Render date: 2024-06-13T08:42:20.320Z Has data issue: false hasContentIssue false
  • English
  • Français

Measuring the Thickness of 2D Materials Using EDS

Published online by Cambridge University Press:  30 July 2020

Samuel Marks ,
Philippe Pinard ,
Simon Burgess ,
Jo Bithell  and
Richard Beanland
Samuel Marks
Affiliation:
Oxford Instruments, High Wycombe, England, United Kingdom
Philippe Pinard
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, England, United Kingdom
Simon Burgess
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, England, United Kingdom
Jo Bithell
Affiliation:
University of Warwick, Coventry, England, United Kingdom
Richard Beanland
Affiliation:
University of Warwick, Coventry, England, United Kingdom

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1212 - 1214
Check for updates
Copyright
Copyright © Microscopy Society of America 2020

References

Geim, A K, Science 324.5934 (2009): 1530–1534.10.1126/science.1158877CrossRefGoogle Scholar
Bianco, A et al. , Carbon (2013): 1–6.10.1016/j.carbon.2013.08.038CrossRefGoogle Scholar
Cliff, G and Lorimer, GW, Journal of Microscopy 103 (1975), 203–20710.1111/j.1365-2818.1975.tb03895.xCrossRefGoogle Scholar
Watanabe, M and Williams, DB, Journal of Microscopy 221 (2006), 89–10910.1111/j.1365-2818.2006.01549.xCrossRefGoogle Scholar
Statham, P, et al. IOP Conf. Ser.: Mater. Sci. Eng. 304 (2017), 01201710.1088/1757-899X/304/1/012017CrossRefGoogle Scholar