Hostname: page-component-848d4c4894-wg55d Total loading time: 0 Render date: 2024-06-10T21:13:15.798Z Has data issue: false hasContentIssue false
  • English
  • Français

Misorientation Mapping for Visualization of Plastic Deformation via Electron Back-Scattered Diffraction

Published online by Cambridge University Press:  24 January 2006

L.N. Brewer ,
M.A. Othon ,
L.M. Young  and
T.M. Angeliu
L.N. Brewer
Affiliation:
General Electric Global Research Center, One Research Circle, Niskayuna, NY 12309, USA L.N. Brewer is now at Sandia National Laboratories, Albuquerque, New Mexico
M.A. Othon
Affiliation:
General Electric Global Research Center, One Research Circle, Niskayuna, NY 12309, USA
L.M. Young
Affiliation:
General Electric Global Research Center, One Research Circle, Niskayuna, NY 12309, USA
T.M. Angeliu
Affiliation:
General Electric Global Research Center, One Research Circle, Niskayuna, NY 12309, USA
Get access

Abstract

The ability to map plastic deformation around high strain gradient microstructural features is central in studying phenomena such as fatigue and stress corrosion cracking. A method for the visualization of plastic deformation in electron back-scattered diffraction (EBSD) data has been developed and is described in this article. This technique is based on mapping the intragrain misorientation in polycrystalline metals. The algorithm maps the scalar misorientation between a local minimum misorientation reference pixel and every other pixel within an individual grain. A map around the corner of a Vickers indentation in 304 stainless steel was used as a test case. Several algorithms for EBSD mapping were then applied to the deformation distributions around air fatigue and stress corrosion cracks in 304 stainless steel. Using this technique, clear visualization of a deformation zone around high strain gradient microstructural features (crack tips, indentations, etc.) is possible with standard EBSD data.

Keywords

EBSDplasticityfractureelectron diffractionmisorientation
Type
MICROANALYSIS
Information
Microscopy and Microanalysis , Volume 12 , Issue 1 , February 2006 , pp. 85 - 91
Copyright
2006 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Ahmed, J., Wilkinson, A.J., & Roberts, S.G. (1999). Study of dislocation structures near fatigue cracks using electron channeling contrast imaging technique (ECCI). J Microsc 195, 197–203.Google Scholar
Angeliu, T.M., Andresen, P.L., Hall, E., Sutliff, J.A., Sitzman, S., & Horn, R.M. (1999). Intergranular stress corrosion cracking of unsensitized stainless steels in BWR environments. In Proceedings of the Ninth International Symposium on Environmental Degradation of Materials in Nuclear Power Systems-Water Reactors, pp. 311–317. Newport Beach, CA.
El Dasher, B.S., Adams, B.L., & Rollett, A.D. (2003). Viewpoint: Experimental recovery of geometrically necessary dislocation density in polycrystals. Scripta Mater 48, 141–145.Google Scholar
Field, D.P., Trivedi, P.B., Wright, S.I., & Kumar, M. (2005). Analysis of local orientation gradients in deformed single crystals. Ultramicroscopy 103, 33–39.Google Scholar
Field, D.P., Wright, S.I., & Trivedi, P. (2003). Microtextural analysis of grain fragmentation in aluminum. Mater Sci Forum 426–432, 3739–3744.Google Scholar
Gerberich, W.W., Davidson, D.L., & Kaczorowski, M. (1990). Experimental and theoretical strain distributions for stationary and growing cracks. J Mech Phys Solids 38, 87–113.Google Scholar
Hu, Y.M., Floer, W., Krupp, U., & Christ, H.J. (2000). Microstructurally short fatigue crack initiation and growth in Ti-6.8Mo-4.5Fe-1.5Al. Mater Sci Eng A 278, 170–180.Google Scholar
Ice, G.E. & Larson, B.C. (2004). Three-dimensional X-ray structural microscopy using polychromatic microbeams. MRS Bull 29, 170–176.Google Scholar
Kamaya, M., Wilkinson, A.J., & Titchmarsh, J.M. (2005). Measurement of plastic strain of polycrystalline material by electron backscatter diffraction. Nucl Eng Des 235, 713–725.Google Scholar
King, W.E., Stolken, J.S., Kumar, M., & Schwartz, A.J. (2000). Strategies for analyzing EBSD datasets. In Electron Backscatter Diffraction in Materials Science, Schwartz, A.J., Kumar, M. & Adams, B.L. (Eds.), pp. 153–169. New York: Kluwer Academic.
Lehockey, E.M., Lin, Y., & Lepik, O.E. (2000). Mapping residual plastic strain in materials using electron backscatter diffraction. In Electron Backscatter Diffraction in Materials Science, Schwartz, A.J., Kumar, M. & Adams, B.L. (Eds.), pp. 247–264. New York: Kluwer Academic.
Li, B.L., Godfrey, A., & Liu, Q. (2002). Investigation of macroscopic grain sub-division of an IF-steel during cold rolling. Mater Sci Forum 408–412, 1185–1190.Google Scholar
Margulies, L., Winther, G., & Poulsen, H.F. (2001). In situ measurement of grain rotation during deformation of polycrystals. Science 291, 2392–2394.Google Scholar
Mino, K., Fukuoka, C., & Yoshizawa, H. (2000). Evolution of intragranular misorientation during plastic deformation. J Jpn Inst Metals 64, 50–55.Google Scholar
Orsund, R., Njelen, J., & Nes, E. (1989). Local lattice curvature and deformation heterogeneities in heavily deformed aluminum. Scripta Metall 23, 1193–1198.Google Scholar
Randle, V., Hansen, N., & Juul Jensen, D. (1996). The deformation behaviour of grain boundary regions in polycrystalline aluminum. Phil Mag A 73, 265–282.Google Scholar
Sun, S., Adams, B.L., & King, W.E. (2000). Observations of lattice curvature near the interface of a deformed aluminium bicrystal. Phil Mag A 80, 9–25.Google Scholar
Sutliff, J.A. (1999). An investigation of plastic strain in copper by automated EBSP. In Microscopy and Microanalysis. Portland, Oregon: Springer Verlag.
Tucker, A.T., Wilkinson, A.J., Henderson, M.B., Ubhi, H.S., & Martin, J.W. (2000). Measurement of fatigue crack plastic zones in fine grain materials using electron backscattered diffraction. Mater Sci Technol 16, 427–430.Google Scholar
Wilkinson, A.J. (2001). A new method for determining small misorientations from electron back scatter diffraction patterns. Scripta Mater 44, 2379–2385.Google Scholar
Wilkinson, A.J. & Dingley, D.J. (1991). Quantitative deformation studies using electron back scatter patterns. Acta Metall 39, 3047–3055.Google Scholar
Wilkinson, A.J., Gonzalez, G., & Dingley, D.J. (1993). The measurement of local plastic deformation in a metal–matrix composite by electron back-scatter patterns. J Micros 169, 255–261.Google Scholar
Wilkinson, A.J., Henderson, M.B., & Martin, J.W. (1996). Examination of fatigue crack plastic zones using scanning-electron-microscope-based electron diffraction techniques. Phil Mag Lett 74, 145–151.Google Scholar
Wright, S.I. (1993). A review of automated orientation imaging microscopy (OIM). J Comput Assist Microsc 5, 207–221.Google Scholar