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Modeling Vibrational EELS: From Bulk to Point Defects

Published online by Cambridge University Press:  30 July 2020

Guillaume Radtke ,
Michele Lazzeri ,
Dario Taverna ,
Nicolas Menguy ,
Fredrik Hage ,
Demie Kepaptsoglou ,
Quentin Ramasse ,
Ondrej Krivanek  and
Tracy Lovejoy
Guillaume Radtke
Affiliation:
Sorbonne Université - CNRS, Paris, Ile-de-France, France
Michele Lazzeri
Affiliation:
Sorbonne Université - CNRS, Paris, Ile-de-France, France
Dario Taverna
Affiliation:
Sorbonne Université - CNRS, Paris, Ile-de-France, France
Nicolas Menguy
Affiliation:
Sorbonne Université - CNRS, Paris, Ile-de-France, France
Fredrik Hage
Affiliation:
SuperSTEM Laboratory and University of Oxford, Daresbury, England, United Kingdom
Demie Kepaptsoglou
Affiliation:
SuperSTEM Laboratory and University of York, Daresbury, England, United Kingdom
Quentin Ramasse
Affiliation:
SuperSTEM Laboratory and University of Leeds, Daresbury, England, United Kingdom
Ondrej Krivanek
Affiliation:
Nion Co., Kirkland, Washington, United States
Tracy Lovejoy
Affiliation:
Nion Co., Kirkland, Washington, United States

Abstract

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Type
Impact of Recent Advancement in Instrumentation/Detectors on Electron Energy Loss Spectroscopy for Physical and Biological Sciences
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 946 - 947
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Copyright
Copyright © Microscopy Society of America 2020

References

Krivanek, O.L., Lovejoy, T. C., Dellby, N., Aoki, T., Carpenter, R.W., Rez, P., Soignard, E., Zhu, J., Batson, P. E., Lagos, M.J., Egerton, R.F. and Crozier, P.A., Nature 514 (2014) p.209.10.1038/nature13870CrossRefGoogle Scholar
Radtke, G., Taverna, D., Lazzeri, M. and Balan, E., Phys. Rev. Lett. 119 (2017) 027402.10.1103/PhysRevLett.119.027402CrossRefGoogle Scholar
Radtke, G., Taverna, D., Menguy, N., Pandolfi, S., Courac, A., Le Godec, Y., Krivanek, O. L., and Lovejoy, T. C., Phys. Rev. Lett. 123 (2019) 256001.10.1103/PhysRevLett.123.256001CrossRefGoogle Scholar
Lovejoy, T.C., Corbin, G.J., Dellby, N., Johnson, N., Hoffman, M.V., Mittelberger, A. and Krivanek, O.L., Microsc. Microanal. 25 (Suppl 2) (2019) 628.10.1017/S1431927619003878CrossRefGoogle Scholar
Hage, F. S., Radtke, G., Kepaptsoglou, D. M., Lazzeri, M. and Ramasse, Q. M., accepted in Science.Google Scholar