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Nanoprobe Endstation with Montel optics and Resolution 50 nm at Taiwan Photon Source
Published online by Cambridge University Press: 10 August 2018
Abstract
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- Abstract
- Information
- Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 208 - 209
- Copyright
- © Microscopy Society of America 2018
References
[2] Yin, G.-C., et al
Proc. SPIE 9592, X-Ray Nanoimaging: Instruments and Methods. II, 959204.Google Scholar