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New Approach for High Quality Cross Sectioning in Tablets using Broad Argon Ion Beam with LN2 Sample Cooling

Published online by Cambridge University Press:  01 August 2018

Rintaro Kawano ,
Yuji Hasebe ,
Yuuki Yamaguchi ,
Noriyoshi Manabe ,
Natasha Erdman  and
Shunsuke Asahina
Rintaro Kawano
Affiliation:
SM Business Unit, JEOL Ltd., Akishima, Tokyo, Japan
Yuji Hasebe
Affiliation:
SM Business Unit, JEOL Ltd., Akishima, Tokyo, Japan
Yuuki Yamaguchi
Affiliation:
SM Business Unit, JEOL Ltd., Akishima, Tokyo, Japan
Noriyoshi Manabe
Affiliation:
Pharmaceutical Physical Chemistry, Tohoku Medical and Pharmaceutical University, Sendai, Japan
Natasha Erdman
Affiliation:
JEOL USA, Inc. Peabody, MA, USA
Shunsuke Asahina
Affiliation:
SM Business Unit, JEOL Ltd., Akishima, Tokyo, Japan

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1424 - 1425
Copyright
© Microscopy Society of America 2018 

References

[1] Taraini, D., et al, Microscopy and Analysis 22 2008) p. 13.Google Scholar
[2] Kuriyama, A., et al, AAPS PharmSciTech 15 2014) p. 375.Google Scholar
[3] Ho, L., et al, Journal of Controlled release 127 2008) p. 79.Google Scholar
[4] Fu, Y., et al, Journal of Controlled release 109 2005) p. 203.Google Scholar
[5] Asahina, S., et al, APL Materials 2 2014) p. 113317.Google Scholar