Hostname: page-component-848d4c4894-2pzkn Total loading time: 0 Render date: 2024-06-08T12:59:49.534Z Has data issue: false hasContentIssue false
  • English
  • Français

Novel Approaches for Electron Tomography to Investigate the Structure and Stability of Nanomaterials in 3 Dimensions.

Published online by Cambridge University Press:  30 July 2020

Sara Bals ,
Wiebke Albrecht ,
Hans Vanrompay ,
Eva Bladt ,
Alexander Skorikov ,
Thais Milagres De Oliveira ,
Naomi Winckelmans ,
Jan-Willem Buurlage ,
Daan Pelt  and
Kees Joost Batenburg
...Show all authors
Sara Bals
Affiliation:
EMAT, NANOLab Center of Excellence, University of Antwerp, Antwerp, Antwerpen, Belgium
Wiebke Albrecht
Affiliation:
EMAT, NANOLab Center of Excellence, University of Antwerp, Antwerp, Antwerpen, Belgium
Hans Vanrompay
Affiliation:
EMAT, NANOLab Center of Excellence, University of Antwerp, Antwerp, Antwerpen, Belgium
Eva Bladt
Affiliation:
EMAT, NANOLab Center of Excellence, University of Antwerp, Antwerp, Antwerpen, Belgium
Alexander Skorikov
Affiliation:
EMAT, NANOLab Center of Excellence, University of Antwerp, Antwerp, Antwerpen, Belgium
Thais Milagres De Oliveira
Affiliation:
EMAT, NANOLab Center of Excellence, University of Antwerp, Antwerp, Antwerpen, Belgium
Naomi Winckelmans
Affiliation:
EMAT, NANOLab Center of Excellence, University of Antwerp, Antwerp, Antwerpen, Belgium
Jan-Willem Buurlage
Affiliation:
CWI, Amsterdam, Noord-Holland, Netherlands
Daan Pelt
Affiliation:
CWI, Amsterdam, Noord-Holland, Netherlands
Kees Joost Batenburg
Affiliation:
CWI, Amsterdam, Noord-Holland, Netherlands
Sandra Van Aert
Affiliation:
EMAT, NANOLab Center of Excellence, University of Antwerp, Antwerp, Antwerpen, Belgium

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
FIB-SEM Technology and Electron Tomography for Materials Science and Engineering
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1128 - 1130
Check for updates
Copyright
Copyright © Microscopy Society of America 2020

References

Winckelmans, N. et al. , The Journal of Physical Chemistry C 122 (2018), p.1352210.1021/acs.jpcc.7b12379CrossRefGoogle Scholar
Smith, J.D. et al. , Angewandte Chemie 59 (2020), p.94310.1002/anie.201913301CrossRefGoogle Scholar
Vanrompay, H. et al. , Nanoscale 10 (2018), p. 2279210.1039/C8NR08376BCrossRefGoogle Scholar
Vanrompay, H. et al. , submittedGoogle Scholar
Albrecht, W. et al. , ACS Nano 13 (2019), p.652210.1021/acsnano.9b00108CrossRefGoogle Scholar
Skorikov, A. et al. , ACS Nano 13 (2019), p.1342110.1021/acsnano.9b06848CrossRefGoogle Scholar
This work was supported by the European Research Council (Grant 815128 REALNANO to SB, Grant 770887 PICOMETRICS to SVA and Grant 797153 SOPMEN to WA, Grant 823717 ESTEEM3). The authors acknowledge financial support from the Research Foundation Flanders (FWO, Belgium) through project fundings, a postdoctoral grant to EB and a doctoral grant to HV.Google Scholar