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Operando Observation of Reversible Oxygen Migration and Phase Transitions in Hafnia-based Ferroelectric Devices

Published online by Cambridge University Press:  22 July 2022

Pavan Nukala
Affiliation:
Center for Nanoscience and Engineering, Indian Institute of Science, Bengaluru, India Zernike Institute of Advanced Materials, University of Groningen, Groningen, The Netherlands
Majid Ahmadi
Affiliation:
Zernike Institute of Advanced Materials, University of Groningen, Groningen, The Netherlands
Yingfen Wei
Affiliation:
Nanoelectronic Devices Laboratory, EPFL, Lausanne, Switzerland,
Sytze de Graaf
Affiliation:
Zernike Institute of Advanced Materials, University of Groningen, Groningen, The Netherlands
Evgenios Stylianidis
Affiliation:
Department of Physics and Astronomy, University College London, Gower Street, London, United Kingdom
Tuhin Chakrabortty
Affiliation:
Center for Nanoscience and Engineering, Indian Institute of Science, Bengaluru, India
Sylvia Matzen
Affiliation:
Center for Nanoscience and Nanotechnology, Paris-Saclay University, CNRS, Palaiseau, France
Henny W. Zandbergen
Affiliation:
Kavli Institute of Nanoscience, Faculty of Applied Sciences, Delft University of Technology, CJDelft, The Netherlands
Alexander Björling
Affiliation:
MAX IV Laboratory, Lund University, Lund, Sweden
Dan Mannix
Affiliation:
MAX IV Laboratory, Lund University, Lund, Sweden University Grenoble Alpes, CNRS, Institut Néel, Grenoble, France European Spallation Source, Lund, Sweden Aarhus University, Langelandsgade 140, Aarhus, Denmark
Dina Carbone
Affiliation:
MAX IV Laboratory, Lund University, Lund, Sweden
Bart Kooi
Affiliation:
Zernike Institute of Advanced Materials, University of Groningen, Groningen, The Netherlands
Beatriz Noheda
Affiliation:
Zernike Institute of Advanced Materials, University of Groningen, Groningen, The Netherlands CogniGron (Groningen Cognitive Systems and Materials Center), University of Groningen, Nijenborgh AG Groningen, Netherlands

Abstract

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Type
Insights into Phase Transitions in Functional Materials by In Situ/Operando TEM: Experiment Meets Theory
Copyright
Copyright © Microscopy Society of America 2022

References

[1] Lee, H.-J., Lee, M., Lee, K., Jo, J., Yang, H., Kim, Y., Chae, S. C., Waghmare, U., Lee, J. H., Scale-free ferroelectricity induced by flat phonon bands in HfO2. Science, 369 , 1343, 2020.Google Scholar
[2] Glinchuk, M. D., Morozovska, A. N., Lukowiak, A., Stręk, W., Silibin, M. V., Karpinsky, D. V., Kim, Y., Kalinin, S. V., Possible electrochemical origin of ferroelectricity in HfO2 thin films. J. Alloys Compd. 830, 153628, 2020Google Scholar
[3] Nukala, P., Ahmadi, M., Wei, Y., de Graaf, S., Stylianidis, E., Chakrabortty, T., Matzen, S., Zandbergen, H., Bjorling, A., Mannix, D., Kooi, B., Noheda, B., “Reversible oxygen migration and phase transitions in hafnia-based ferroelectric devices”, Science, 372, 630, 2021.Google Scholar