Hostname: page-component-848d4c4894-wzw2p Total loading time: 0 Render date: 2024-06-10T16:13:45.972Z Has data issue: false hasContentIssue false
  • English
  • Français

Probing the Cation Distribution in Gamma-alumina Enabled by O-K Edge Artifact Suppression Using Cryo-EELS

Published online by Cambridge University Press:  30 July 2020

Henry Ayoola ,
Cheng-Han Li ,
Stephen House ,
Joshua Kas ,
John Rehr ,
Joerg Jinschek ,
Wissam Saidi ,
Judith Yang  and
Cecile Bonifacio
Henry Ayoola
Affiliation:
University of Pittsburgh, Pittsburgh, Pennsylvania, United States
Cheng-Han Li
Affiliation:
The Ohio State University, Columbus, Ohio, United States
Stephen House
Affiliation:
University of Pittsburgh, Pittsburgh, Pennsylvania, United States
Joshua Kas
Affiliation:
University of Washington, Seattle, Washington, United States
John Rehr
Affiliation:
University of Washington, Seattle, Washington, United States
Joerg Jinschek
Affiliation:
The Ohio State University, Columbus, Ohio, United States
Wissam Saidi
Affiliation:
University of Pittsburgh, Pittsburgh, Pennsylvania, United States
Judith Yang
Affiliation:
University of Pittsburgh, Pittsburgh, Pennsylvania, United States
Cecile Bonifacio
Affiliation:
E.A. Fischione Instruments, Inc., Export, Pennsylvania, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Energy and Soft Materials and the Development of Cryogenic Techniques for Studying Them
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 2550 - 2552
Check for updates
Copyright
Copyright © Microscopy Society of America 2020

References

Verwey, E.J.W., Zeitschrift für Kristallographie - Crystalline Materials, (1935), p. 65.Google Scholar
Ayoola, H.O., et al. ., Acta Materialia, 182 (2020) p. 257-266.10.1016/j.actamat.2019.10.027CrossRefGoogle Scholar
Ealet, B., et al. ., Thin Solid Films, 250 (1994) p. 92-100.10.1016/0040-6090(94)90171-6CrossRefGoogle Scholar
Jayaram, V. and Levi, C.G., Metallurgica, Acta, 37 (1989) p. 569-578.Google Scholar
Smrcok, L., Langer, V. and Krestan, J., Acta Crystallographica C, 62 (2006) i83-84.10.1107/S0108270106026850CrossRefGoogle Scholar
Jorissen, K., Rehr, J.J. and Verbeeck, J., Physical Review B, 81 (2010), 155108.Google Scholar
The authors acknowledge support from NSF CHE-1300544, CHE-1534630 and DOE-BES (DE-FG02-97ER45623). WAS acknowledges start-up funding from the Mechanical Eng. and Materials Science Dept. at U. Pittsburgh. The experimental data was acquired using instruments at the Nanoscale Fabrication and Characterization Facility (NFCF) at The University of Pittsburgh, and at the Center for Electron Microscopy and Analysis (CEMAS) at OSU.Google Scholar