Hostname: page-component-848d4c4894-hfldf Total loading time: 0 Render date: 2024-06-12T18:27:26.336Z Has data issue: false hasContentIssue false
  • English
  • Français

Rapid Automated Preparation for Serial Block Face Scanning Electron Microscopy

Published online by Cambridge University Press:  05 August 2019

Steven L Goodman ,
Emily K Benson ,
Jay M Campbell  and
Grahame J Kidd
Steven L Goodman*
Affiliation:
Microscopy Innovations LLC, Marshfield, WI, USA.
Emily K Benson
Affiliation:
Renovo Neural Inc., Cleveland, OH, USA.
Jay M Campbell
Affiliation:
Microscopy Innovations LLC, Marshfield, WI, USA. University of Wisconsin-Madison School of Medicine and Public Health, Madison, WI, USA.
Grahame J Kidd
Affiliation:
University of Wisconsin-Madison School of Medicine and Public Health, Madison, WI, USA.
*
*Corresponding author: Steven.Goodman@MicroscopyInnovations.com

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Utilizing Microscopy for Research and Diagnosis of Diseases in Humans, Plants and Animals
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1182 - 1183
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Strader, TE et al. , Microsc. Microanal 24 (2018), p. 1284.Google Scholar
[2]Marques, P et al. , Microsc. Microanal 24 (2018), p. 1300.Google Scholar