Hostname: page-component-848d4c4894-2pzkn Total loading time: 0 Render date: 2024-06-02T20:33:27.828Z Has data issue: false hasContentIssue false
  • English
  • Français

A Reconstruction Wizard for Electrostatic Reconstruction

Published online by Cambridge University Press:  22 July 2022

Brian P. Geiser ,
David Reinhard ,
Joseph Bunton ,
David Larson ,
Robert Ulfig ,
Katherine P. Rice ,
Isabelle Martin ,
Yimeng Chen ,
Ty Prosa  and
Tim Payne
Brian P. Geiser*
Affiliation:
CAMECA Instruments Inc, Fitchburg, WI, USA
David Reinhard
Affiliation:
CAMECA Instruments Inc, Fitchburg, WI, USA
Joseph Bunton
Affiliation:
CAMECA Instruments Inc, Fitchburg, WI, USA
David Larson
Affiliation:
CAMECA Instruments Inc, Fitchburg, WI, USA
Robert Ulfig
Affiliation:
CAMECA Instruments Inc, Fitchburg, WI, USA
Katherine P. Rice
Affiliation:
CAMECA Instruments Inc, Fitchburg, WI, USA
Isabelle Martin
Affiliation:
CAMECA Instruments Inc, Fitchburg, WI, USA
Yimeng Chen
Affiliation:
CAMECA Instruments Inc, Fitchburg, WI, USA
Ty Prosa
Affiliation:
CAMECA Instruments Inc, Fitchburg, WI, USA
Tim Payne
Affiliation:
CAMECA Instruments Inc, Fitchburg, WI, USA
*
*Corresponding author: Brian.Geiser@ametek.com

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Expanding the Limits of Atom Probe Tomography
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 704 - 705
Check for updates
Copyright
Copyright © Microscopy Society of America 2022

References

Bas, P., et al. , Appl. Surf. Sci. 87/88 (1995) 298.10.1016/0169-4332(94)00561-3CrossRefGoogle Scholar
De Geuser, F. and Gault, B., Microscopy and Microanalysis 23 (2017), p. 238. doi: 10.1017/S1431927620022217CrossRefGoogle Scholar
Geiser, B. et al. , Microscopy and Microanalysis 26 (2020), p. 2622. doi: 10.1017/S1431927619002411CrossRefGoogle Scholar
Geiser, B. et al. , Microscopy and Microanalysis 27 (2021), p. 2482. doi: 10.1017/S1431927621008850CrossRefGoogle Scholar
Geiser, B. et al. , Microscopy and Microanalysis 25 (2019), p. 336. doi: 10.1017/S1431927619002411CrossRefGoogle Scholar
Haley, D. et al. , Microscopy and Microanalysis 25 (2019), p. 331. doi: 10.1017/S1431927618015507CrossRefGoogle Scholar