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Silicon Drift Detectors in Electron Microscopy - An Over 20 Year History with a Bright Future

Published online by Cambridge University Press:  01 August 2018

A. Liebel ,
A. Schöning ,
A. Bechteler ,
K. Hermenau ,
K. Heinzinger ,
L. Strüder ,
A. Niculae  and
H. Soltau
A. Liebel
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, D-81739München, Germany
A. Schöning
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, D-81739München, Germany
A. Bechteler
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, D-81739München, Germany
K. Hermenau
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, D-81739München, Germany
K. Heinzinger
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, D-81739München, Germany
L. Strüder
Affiliation:
University of Siegen, Department of Physics, Walter-Flex-Str. 3, 57068Siegen, Germany
A. Niculae
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, D-81739München, Germany
H. Soltau
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, D-81739München, Germany

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 796 - 797
Copyright
© Microscopy Society of America 2018 

References

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[2] Niculae, A, et al, Proceedings of Microscopy & Microanalysis volume 22(S3 2016) pp. 42–43.Google Scholar
[3] Schlossmacher, P, et al, Microscopy Today vol. 18(4 2010) pp. 14–20.Google Scholar
[4] von Harrach, HS, et al, Journal of Physics Conference Series volume 241(1), ( 2010.Google Scholar
[5] Niculae, A, et al, Proceedings of Microscopy & Microanalysis volume 22(S3 2016) pp. 40–41.Google Scholar
[6] Bombelli, L., et al, IEEE Nuclear Science Symposium Conference (NSS/MIC), ISBN 978-1-42449105-6 (2010).Google Scholar