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Single-shot X-ray Dark-field Imaging

Published online by Cambridge University Press:  10 August 2018

Zhili Wang ,
Dalin Liu ,
Kun Ren ,
Xiaomin Shi  and
Jianlin Xia
Zhili Wang*
Affiliation:
School of Electronic Science & Applied Physics, Hefei University of Technology, Hefei, People's Republic of China
Dalin Liu
Affiliation:
School of Electronic Science & Applied Physics, Hefei University of Technology, Hefei, People's Republic of China
Kun Ren
Affiliation:
School of Electronic Science & Applied Physics, Hefei University of Technology, Hefei, People's Republic of China
Xiaomin Shi
Affiliation:
School of Electronic Science & Applied Physics, Hefei University of Technology, Hefei, People's Republic of China
Jianlin Xia
Affiliation:
School of Electronic Science & Applied Physics, Hefei University of Technology, Hefei, People's Republic of China
*
*dywangzl@hfut.edu.cn

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 128 - 129
Copyright
© Microscopy Society of America 2018 

References

[1] Pfeiffer, F, et al, Nat. Mater. 7 2008 134.Google Scholar
[2] Yashiro, W, et al, Opt. Express 18 2010 16890.Google Scholar
[3] Bravin, A, et al, Phys. Med. Biol. 58 2013 R1.Google Scholar
[4] Chabior, M, et al, J. Appl. Phys. 110 2011 053105.Google Scholar
[5] Marschner, M, et al, Opt. Express 24 2016 27032.Google Scholar
[6] The authors acknowledge funding from the National Natural Science Foundation of China (11475170, U1532113, 11205157).Google Scholar