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Structural Properties of (Sn,Mn)Se2- a New 2D Magnetic Semiconductor with Potential for Spintronic Applications

Published online by Cambridge University Press:  25 July 2016

V. Kanzyuba ,
S. Dong ,
X. Li ,
T. Yoo ,
X. Liu ,
S. Rouvimov ,
S. Vishwanath ,
D. Jena ,
H.G. Xing  and
M. Dobrowolska
...Show all authors
V. Kanzyuba
Affiliation:
Dept. of Physics, University of Notre Dame, Notre Dame, IN 46556, USA
S. Dong
Affiliation:
Dept. of Physics, University of Notre Dame, Notre Dame, IN 46556, USA
X. Li
Affiliation:
Dept. of Physics, University of Notre Dame, Notre Dame, IN 46556, USA
T. Yoo
Affiliation:
Dept. of Physics, University of Notre Dame, Notre Dame, IN 46556, USA Dept. of Physics, Korea University, Seoul 136-701, Korea
X. Liu
Affiliation:
Dept. of Physics, University of Notre Dame, Notre Dame, IN 46556, USA
S. Rouvimov
Affiliation:
Dept. of Electrical Engineering, University of Notre Dame, Notre Dame, IN 46556, USA Notre Dame Integ.Imaging Facility, Univ. of Notre Dame, Notre Dame, IN 46556, USA
S. Vishwanath
Affiliation:
Dept. of Electrical Engineering, University of Notre Dame, Notre Dame, IN 46556, USA School of Electrical and Computer Engineering, Cornell Univ., Ithaca, NY 14853, USA
D. Jena
Affiliation:
Dept. of Electrical Engineering, University of Notre Dame, Notre Dame, IN 46556, USA School of Electrical and Computer Engineering, Cornell Univ., Ithaca, NY 14853, USA Dept. of Materials Science and Engineering, Cornell Univ., Ithaca, NY 14853, USA
H.G. Xing
Affiliation:
Dept. of Electrical Engineering, University of Notre Dame, Notre Dame, IN 46556, USA School of Electrical and Computer Engineering, Cornell Univ., Ithaca, NY 14853, USA Dept. of Materials Science and Engineering, Cornell Univ., Ithaca, NY 14853, USA
M. Dobrowolska
Affiliation:
Dept. of Physics, University of Notre Dame, Notre Dame, IN 46556, USA
J. K. Furdyna
Affiliation:
Dept. of Physics, University of Notre Dame, Notre Dame, IN 46556, USA

Abstract

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Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1512 - 1513
Copyright
© Microscopy Society of America 2016 

References

References:

1. Pan, T. S., et al., Applied Physics Letters 103, 093108 (2013).CrossRefGoogle Scholar
2. Zhou, X., et al., Advanced Materials 27, 8035 (2015).CrossRefGoogle Scholar
3. Zhang, K., et al., Nano Letters 15, 6586 (2015).CrossRefGoogle Scholar
4. Zhang, Y., et al., Nature Nanotechnology 9, 111–115, 2014.CrossRefGoogle Scholar
5. Kim, D., et al., Nature Physics 8, 459–463, 2012.CrossRefGoogle Scholar
6. The authors acknowledge funding from NSF Grants DMR14-00432 and DMR14-33490.Google Scholar