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Studying the UO2 Electrochemistry In Situ Using SEM

Published online by Cambridge University Press:  30 July 2020

Xiao-Ying Yu ,
Jennifer Yao ,
Sayandev Chatterjee ,
Jiyoung Son  and
Edgar Buck
Xiao-Ying Yu
Affiliation:
Pacific Northwest National Laboratory, Richland, Washington, United States
Jennifer Yao
Affiliation:
Pacific Northwest National Laboratory, Richland, Washington, United States
Sayandev Chatterjee
Affiliation:
Pacific Northwest National Laboratory, Richland, Washington, United States
Jiyoung Son
Affiliation:
Pacific Northwest National Laboratory, Richland, Washington, United States
Edgar Buck
Affiliation:
Pacific Northwest National Laboratory, Richland, Washington, United States

Abstract

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Type
Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens - Correlation of Spectroscopic Methods with Microanalysis
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1790 - 1792
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Copyright
Copyright © Microscopy Society of America 2020

References

Jerden, JL et al. ., J. Nucl. Mater. 462, (2015), 135-146. doi: 10.1016/j.jnucmat.2015.03.036.CrossRefGoogle Scholar
Buck, EC et al. ., RSC Advances, 8 (2018), 18227-18233.10.1039/C8RA01706ACrossRefGoogle Scholar
Yu, X-Y, et al. ., Proceedings of the International High-Level Radioactive Waste Management (IHLRWM) Conference, Analysis of radioactive materials in liquid using in situ SEM and ToF-SIMS, April, 2019.Google Scholar
Yang, L et al. ., J. Vac. Sci. Technol. A 29 (2011), art. no., 061101. doi: 10.1116/1.3654147.CrossRefGoogle Scholar
Yang, L et al. ., Lab Chip 11 (2011), 2481-4. doi: 10.1039/c01c00676a.CrossRefGoogle Scholar
Yu, J et al. ., Chem. Comm. (2016), 52, 10952-5. doi: 10.1039/c6cc02893d.CrossRefGoogle Scholar
Yao, J et al. ., J. Vis. Exp (2017), 127, e56058. doi: 10.3791/56058.Google Scholar
Yu, X-Y et al. ., Surface Interface Analysis (2019), 51 (13), 1325. doi: 10.1002/sia.6700Google Scholar
We acknowledge support from the U.S. Department of Energy (DOE) Nuclear Energy (NE) Spent Fuel and Waste Science and Technology (SFWST) program.Google Scholar