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Surface-Interface Quality of Mn5Ge3 Thin Films on Ge(001): Reactive Deposition Epitaxy vs. Solid Phase Epitaxy

Published online by Cambridge University Press:  01 August 2018

Adriana Alvídrez-Lechuga
Affiliation:
Centro de Investigación en Materiales Avanzados, S.C. (CIMAV), Chihuahua, Chih., Mexico.
José T. Holguín-Momaca
Affiliation:
Centro de Investigación en Materiales Avanzados, S.C. (CIMAV), Chihuahua, Chih., Mexico.
Óscar O. Solís-Canto
Affiliation:
Centro de Investigación en Materiales Avanzados, S.C. (CIMAV), Chihuahua, Chih., Mexico.
Carlos R. Santillán-Rodríguez
Affiliation:
Centro de Investigación en Materiales Avanzados, S.C. (CIMAV), Chihuahua, Chih., Mexico.
José A. Matutes-Aquino
Affiliation:
Centro de Investigación en Materiales Avanzados, S.C. (CIMAV), Chihuahua, Chih., Mexico.
Sion F. Olive-Méndez
Affiliation:
Centro de Investigación en Materiales Avanzados, S.C. (CIMAV), Chihuahua, Chih., Mexico.

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

[1] Egues, J. C., Burkard, G. Loss, D. Appl. Phys. Lett 82 2003) p. 2658.Google Scholar
[2] Zhu, J.J. Park, Ch. Materials today 9 2006) p. 36.Google Scholar
[3] Zeng, C., et al, Appl. Phys. Lett 83 2003) p. 5002.Google Scholar
[4] Olive-Méndez, S., et al, Thin Solid Films 517 2008) p. 191.Google Scholar
[5] Authors thank the financial support obtained from Ciencia-Básica SEP-CONACYT grant No. 157559 and Fondo Mixto Chihuahua FOMIX grant No. CHIH-2011-C03-168831.Google Scholar